In a world increasingly facing new challenges at the forefront of plasma scientific research and technological innovation, CNR and ISTP pledge progress and achieve an impact in the integration of research into societal practices and policy
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disruption
Showing all 5 results
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Plasma physics and controlled fusion (Print) 63 (7), pp. 075013-1 - 075013-12 Year: 2021 DOI: 10.1088/1361-6587/abffba
Model based computation of electromagnetic forces in magnetic confinement toroidal devices by using magnetic measurements
Abate D.; Marchiori G.; Berton G.; Bonotto M.; Cordaro L.; Grando L.; Bettini P. -
Nuclear fusion 62 (7), pp. 076038-1 - 076038-12 Year: 2022 DOI: 10.1088/1741-4326/ac544e
Full conversion from ohmic to runaway electron driven current via massive gas injection in the TCV tokamak
Decker J.; Papp G.; Coda S.; Duval B.P.; Sheikh U.; Blanchard P.; Choi D.; Galperti C.; Calacci L.; Carnevale D.; Ficker O.; Gobbin M.; Labit B.; Macusova E.; Mlynar J.; Plyusnin V.; Sauter O. -
Plasma physics and controlled fusion (Print) 64 (3), pp. 034002-1 - 034002-11 Year: 2022 DOI: 10.1088/1361-6587/ac48bc
Physics of runaway electrons with shattered pellet injection at JET
Reux, C.; Paz-Soldan, C.; Eidietis, N.; Lehnen, M.; Aleynikov, P.; Silburn, S.; Bandaru, V; Ficker, O.; Hoelzl, M.; Hollmann, E. M.; Jachmich, S.; Joffrin, E.; Lomas, P. J.; Rimini, F.; Baylor, L.; Bleasdale, A.; Calacci, L.; Causa, F.; Carnevale, D.; [ Et al. ] -
Plasma physics and controlled fusion (Online) 63 (1), pp. 115006-1 - 115006-14 Year: 2021 DOI: 10.1088/1361-6587/ac234b
Thermal quench and current profile relaxation dynamics in massive-material-injection-triggered tokamak disruptions
Nardon E.; Hu D.; Artola F.J.; Bonfiglio D.; Hoelzl M.; Boboc A.; Carvalho P.; Gerasimov S.; Huijsmans G.; Mitterauer V.; Schwarz N.; Sun H.; the JOREK team; JET contributors -
Nuclear fusion 59 (11), pp. 112012-1 - 112012-12 Year: 2019 DOI: 10.1088/1741-4326/ab15de
Progress in disruption prevention for ITER
Strait, E. J.; Barr, J. L.; Baruzzo, M.; Berkery, J. W.; Buttery, R. J.; de Vries, P. C.; Eidietis, N. W.; Granetz, R. S.; Hanson, J. M.; Holcomb, C. T.; Humphreys, D. A.; Kim, J. H.; Kolemen, E.; Kong, M.; [ Et al. ]
