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A GEM-based high-rate x-rays diagnostic for flux measurement during high voltage conditioning in vacuum insulated systems
McCormack O.; Muraro A.; Croci G.; Grosso G.; Pilan N.; Lotto L.; Spagnolo S.; De Lorenzi A.; Gobbo R.; Fontana C.L.; Gorini G.; Fincato M.; Martines E.; Pino F.; Rigamonti D.; Perelli Cippo E.; Rossetto F.; Spada E.; Zuin M.; [ Et al. ]