electron beam (EBIS))
Showing all 3 results
-
Journal of instrumentation 18 pp. C06028-1 - C06028-9 Year: 2023 DOI: 10.1088/1748-0221/18/06/C06028
Influence of plasma parameters on the effectiveness of multi-cusp magnetic field confinement in negative ion sources
Candeloro V.; Sartori E.; Serianni G. -
Journal of instrumentation 14 pp. C0935-1 - C0935-12 Year: 2019 DOI: 10.1088/1748-0221/14/09/C09035
High Resolution Probe for filament transport and current density study at the edge region of W7-X
Spolaore, M.; Agostinetti, P.; Killer, C.; Moresco, M.; Brombin, M.; Cavazzana, R.; Ghiraldelli, R.; Grenfell, G.; Grulke, O.; Lazerson, S. A.; Martines, E.; Neubauer, O.; Nicolai, D.; Satheeswaran, G.; Schweer, B.; Vianello, N.; Visentin, M. -
Journal of instrumentation 18 pp. C03009-1 - C03009-10 Year: 2023 DOI: 10.1088/1748-0221/18/03/C03009
Numerical and experimental investigations of a microwave interferometer for the negative ion source SPIDER
Agnello R.; Cavazzana R.; Furno I.; Jacquier R.; Pasqualotto R.; Sartori E.; Serianni G.
English
Italiano