Movable electrical probes were used to diagnose the beam flux profile and potential of ion beams since the early 1960s. Experimental measurements of beam plasmas can provide essential data related to the space charge neutralization, but the current-voltage characteristics obtained from such electrical probes are dominated by beam ion impact and ion-induced secondary emission. In this work, we present an analysis of the Langmuir characteristics obtained in a negative ion beam. We identify and discuss separately the contributions to the collected current given by secondary plasma ions and electrons, stripped electrons, beam ions, and ion-induced secondary electron emission. We present the beam plasma parameters obtained at different beam energies in NIO1.
Analysis of current-voltage characteristics for Langmuir probes immersed in an ion beam
Sartori E.; Candeloro V.; Serianni G.
Journal:
Review of scientific instruments 91 (2),
pp. 023504-1 - 023504-6
Year:
2020
ISTP Authors: Gianluigi Serianni
Keywords: negative ions, Ion beams, Beam plasma interactions, Ion bombardment, Probes, Secondary emission
Research Activitie: JOURNAL ARTICLES
ID | 417952 |
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DOI | 10.1063/1.5128669 |
PRODUCT TYPE | Journal Article |
LAST UPDATE | 2023-02-03T16:12:53Z |
EU PROJECT | EUROfusion |
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TITLE | Implementation of activities described in the Roadmap to Fusion during Horizon 2020 through a Joint programme of the members of the EUROfusion consortium |
FOUNDING PROGRAM | H2020 |