{"id":6875,"date":"2020-03-27T10:54:48","date_gmt":"2020-03-27T10:54:48","guid":{"rendered":"https:\/\/www.istp.cnr.it\/?post_type=product&#038;p=6875"},"modified":"2022-06-21T09:56:44","modified_gmt":"2022-06-21T09:56:44","slug":"conceptual-design-of-jt-60sa-edge-thomson-scattering-diagnostic-2","status":"publish","type":"product","link":"https:\/\/www.istp.cnr.it\/it\/research-product\/conceptual-design-of-jt-60sa-edge-thomson-scattering-diagnostic-2\/","title":{"rendered":"Conceptual design of JT-60SA edge Thomson scattering diagnostic"},"content":{"rendered":"<p>JT-60SA will complement ITER in resolving key issues to finally decide an acceptable DEMO design. Diagnostics play a key role in this mission. The electron temperature and density profiles are measured by a core and an edge Thomson scattering (TS) diagnostics with high spatial resolution, needed to identify the pedestal parameters and small profile structures. The two systems use a common tangential Nd:YAG laser beam path in the plasma equatorial plane. The collection optics for the edge system (low field side) is hosted in a lower oblique port and that for the coresystem in a horizontal port. The optics fit in the port plug tube and image the scattering volumes into an array of fiber bundles. They both are exposed to a high neutron dose of1016n\/cm2over 13years of operation. The optics are supported by a mechanical structure decoupled from the cryostat.A set of filter polychromators with avalanche photodiode (APD) detectors spectrally analyze the scattered radiation. The development of the TS systems is carried out by a joint Japan-EU team.The conceptual design of the edge TS system is presented here. Simulations of the TS signals show acceptable accuracy down to1\u00d71019m-3electron density, sufficient to measure the edge gradient and even a small region outside the separatrix.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Pasqualotto R.; Tojo H.; Fassina A.; Giudicotti L.; Nardino V.; Oyama N.; Pelli S.; Raimondi V.; Ricciarini S.; Soare S.; Davis S.; Sozzi C.<\/p>\n","protected":false},"featured_media":1294,"comment_status":"closed","ping_status":"open","template":"","meta":[],"product_cat":[574],"product_tag":[1095,1096,1469,1470,1471,1472,1473,1474,1475,1476,1477,1478,1479,1480],"class_list":["post-6875","product","type-product","status-publish","has-post-thumbnail","hentry","product_cat-journal-articles","product_tag-plasma-diagnostics-interferometry","product_tag-spectroscopy-and-imaging","product_tag-optics","product_tag-photon-de-tectors-for-uv","product_tag-visible-and-ir-photons-solid-state-pin-diodes","product_tag-apds","product_tag-si-pmts","product_tag-g-apds","product_tag-ccds","product_tag-ebccds","product_tag-emccds","product_tag-cmos-imagers","product_tag-etc","product_tag-spectrometers","prodpage-style2"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/product\/6875","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/comments?post=6875"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/media\/1294"}],"wp:attachment":[{"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/media?parent=6875"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/product_cat?post=6875"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/www.istp.cnr.it\/it\/wp-json\/wp\/v2\/product_tag?post=6875"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}